Automatic test system for CCDs

Technical Report · Mon Jun 01 04:00:00 EDT 1981

OSTI ID:6453378

McConaghy, C F

This report describes an automatic test system for measuring the AC characteristics of charge coupled devices (CCD). The purpose of this system is to increase throughput and to remove the necessity of having an operator present to make numerous tedious measurements. The test system measures the diffusion voltage at which charge first injects into the CCD. In addition, it measures the output amplitude in millivolts corresponding to a full well condition as well as the input diffusion voltage corresponding to this condition. Finally, it returns the value of charge transfer efficiency (CTE) when biased at full well so a decision can be made whether a particular CCD channel is good or bad. The system is currently set up to measure a five channel linear CCD, but can easily be adapted to handle any number of channels including a four channel SPS CCD. Each CCD channel is characterized separately.

• Research Organization: Lawrence Livermore National Lab., CA (USA)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 6453378
• Report Number(s): UCID-19077; ON: DE81025888
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
CHARGE-COUPLED DEVICES
OPERATION
PERFORMANCE TESTING
SEMICONDUCTOR DEVICES
TEST FACILITIES
TESTING