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Selective etching of Al[sub x]Ga[sub 1[minus]x]As and In(Al[sub x]Ga[sub 1[minus]x])As alloys in succinic acid-hydrogen peroxide solutions

Conference · · Journal of the Electrochemical Society; (United States)
OSTI ID:6446201
; ;  [1]
  1. Univ. of Texas, Austin (United States)

Selective etching plays a vital role in compound semiconductor device fabrication. Succinic acid-hydrogen peroxide solutions were used to etch Al[sub x]Ga[sub 1[minus]x]As and In(Al[sub x]Ga[sub 1[minus]x])As alloys, and the etch rates were investigated with the varying alloy mole fractions. It was found that Al[sub x]Ga[sub 1[minus]x]As (x[le]0.4) may be selectively etched over Al[sub y]Ga[sub 1[minus]y]As(y[ge]0.5), with a selectivity better than 150. Extended surface exposure to air was found to affect the etch rates, most interestingly for Al[sub 0.4]Ga[sub 0.6]As. In the In(Al[sub x]Ga[sub 1[minus]x])As system, alloys with x[le]0.8 can be preferentially etched over In[sub 0.52]Al[sub 0.48]As with a selectivity of better than 20.

OSTI ID:
6446201
Report Number(s):
CONF-901101--
Journal Information:
Journal of the Electrochemical Society; (United States), Journal Name: Journal of the Electrochemical Society; (United States) Vol. 140:5; ISSN JESOAN; ISSN 0013-4651
Country of Publication:
United States
Language:
English