Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Internal stresses and strains in coherent multilayers

Journal Article · · Acta Materialia
 [1];  [1];  [1]
  1. Wright Lab., Wright-Patterson AFB, OH (United States). Materials Directorate

Formulae are given for the strain and stress tensors in a periodic multilayer which may contain any number of layers, each with a different lattice parameter, different elastic constants and different thickness. The layers are assumed to be parallel sided, elastically isotropic and to have a thickness much smaller than the dimensions in the plane of the layers. The results are applied to metal and semiconductor heterostructures which contain equi-biaxial tensions and compressions and to lamellar Ti-Al in which there are additional in-plane shears. A preliminary discussion is given of the loss of coherency in a multilayer with layers of different thicknesses.

OSTI ID:
644300
Report Number(s):
CONF-9704224--
Journal Information:
Acta Materialia, Journal Name: Acta Materialia Journal Issue: 11 Vol. 46; ISSN 1359-6454; ISSN ACMAFD
Country of Publication:
United States
Language:
English

Similar Records

Coherency and loss of coherency in multilayers
Conference · Wed Dec 30 23:00:00 EST 1998 · OSTI ID:305513

Generalized formula for curvature radius and layer stresses caused by thermal strain in semiconductor multilayer structures
Journal Article · Fri Dec 31 23:00:00 EST 1982 · J. Appl. Phys.; (United States) · OSTI ID:6801609

Yield stress of nano- and micro-multilayers
Book · Mon Dec 30 23:00:00 EST 1996 · OSTI ID:490767