Internal stresses and strains in coherent multilayers
Journal Article
·
· Acta Materialia
- Wright Lab., Wright-Patterson AFB, OH (United States). Materials Directorate
Formulae are given for the strain and stress tensors in a periodic multilayer which may contain any number of layers, each with a different lattice parameter, different elastic constants and different thickness. The layers are assumed to be parallel sided, elastically isotropic and to have a thickness much smaller than the dimensions in the plane of the layers. The results are applied to metal and semiconductor heterostructures which contain equi-biaxial tensions and compressions and to lamellar Ti-Al in which there are additional in-plane shears. A preliminary discussion is given of the loss of coherency in a multilayer with layers of different thicknesses.
- OSTI ID:
- 644300
- Report Number(s):
- CONF-9704224--
- Journal Information:
- Acta Materialia, Journal Name: Acta Materialia Journal Issue: 11 Vol. 46; ISSN 1359-6454; ISSN ACMAFD
- Country of Publication:
- United States
- Language:
- English
Similar Records
Coherency and loss of coherency in multilayers
Generalized formula for curvature radius and layer stresses caused by thermal strain in semiconductor multilayer structures
Yield stress of nano- and micro-multilayers
Conference
·
Wed Dec 30 23:00:00 EST 1998
·
OSTI ID:305513
Generalized formula for curvature radius and layer stresses caused by thermal strain in semiconductor multilayer structures
Journal Article
·
Fri Dec 31 23:00:00 EST 1982
· J. Appl. Phys.; (United States)
·
OSTI ID:6801609
Yield stress of nano- and micro-multilayers
Book
·
Mon Dec 30 23:00:00 EST 1996
·
OSTI ID:490767