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Neutron radiation effects in GaAs planar doped barrier diodes

Journal Article · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/23.212324· OSTI ID:6440231
;  [1];  [2];  [3]
  1. GEC-Marconi Ltd., Wembley (United Kingdom)
  2. Rutherford-Appleton Lab., Chilton (United Kingdom)
  3. GEC Plessey Semiconductors, Lincoln (United Kingdom)
The planar doped barrier (PDB) diode has recently been shown to be a very attractive alternative to the Schottky diode for many microwave and millimeter-wave mixer and detector applications. The authors have studied the degradation of GaAs planar doped barrier diodes subject to neutron irradiation. For fluences as high as 10[sup 15] cm[sup [minus]2] the diode characteristics are very well preserved, which strengthens the rationale for using these devices in place of Schottky diodes in harsh working environments such as nuclear instrumentation and space.
OSTI ID:
6440231
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 40:2; ISSN 0018-9499; ISSN IETNAE
Country of Publication:
United States
Language:
English

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