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Soft x-ray tomography on TFTR

Technical Report ·
DOI:https://doi.org/10.2172/6433076· OSTI ID:6433076

The tomographic method used for deriving soft x-ray local emissivities on TFTR, using one horizontal array of 60 soft x-ray detectors, is described. This method, which is based on inversion of Fourier components and subsequent reconstruction, has been applied to the study of a sawtooth crash. A flattening in the soft x-ray profile, which we interpret as an m = 1 island, is clearly visible during the precursor phase and its location and width correlate well with those from electron temperature profiles reconstructed from electron cyclotron emission measurement. The limitations of the Fourier method, due notably to the aperiodic nature of the signals in the fast crash phase and the difficulty of obtaining accurately the higher Fourier harmonics, are discussed. 9 refs., 13 figs.

Research Organization:
Princeton Univ., NJ (USA). Plasma Physics Lab.
DOE Contract Number:
AC02-76CH03073
OSTI ID:
6433076
Report Number(s):
PPPL-2555; ON: DE89006858
Country of Publication:
United States
Language:
English