Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Injected-carrier induced refractive-index change in semiconductor lasers

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.92550· OSTI ID:6426972

A red-shift in the diode modes with increasing optical feedback is observed in external-cavity Al/sub x/Ga/sub 1-x/As injection lasers. This shift is due to a change in the refractive index in the active region resulting from a reduction in the population-inversion induced by the optical feedback. This leads to a new determination of the carrier dependence of the refractive index at the laser wavelength in the active region of semiconductor lasers independent of current-induced thermal effects.

Research Organization:
Cornell University, Ithaca, New York 14853
OSTI ID:
6426972
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 39:1; ISSN APPLA
Country of Publication:
United States
Language:
English