Atomic Force Microscopy Study of an Ideally Hard Contact: The Diamond{bold (}111{bold )}/Tungsten Carbide Interface

Journal Article · Sat Aug 01 00:00:00 EDT 1998 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.81.1877· OSTI ID:641674

Enachescu, M; van den Oetelaar, R J; Carpick, R W; Ogletree, D F; Flipse, C F; Salmeron, M ^[1]

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1. Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 (United States)

A comprehensive nanotribological study of a hydrogen-terminated diamond(111)/tungsten carbide interface has been performed using ultrahigh vacuum atomic force microscopy. Both contact conductance, which is proportional to contact area, and friction have been measured as a function of applied load. We demonstrate for the first time that the load dependence of the contact area in UHV for this extremely hard single asperity contact is described by the Derjaguin-M{umlt u}ller-Toporov continuum mechanics model. Furthermore, the frictional force is found to be directly proportional to the contact area. {copyright} {ital 1998} {ital The American Physical Society}

• Research Organization: Lawrence Berkeley National Laboratory
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 641674
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 9 Vol. 81; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ADHESION
CARBON COMPOUNDS
DIAMONDS
FRICTION
HYDROGEN
INTERFACES
PASSIVATION
SURFACE TREATMENTS
TRIBOLOGY
TUNGSTEN CARBIDES
TUNGSTEN COMPOUNDS