Correlation between the performance and metrology of glancing-incidence synchrotron-radiation mirrors containing millimeter-wavelength shape errors

Conference · Thu Jan 01 04:00:00 EST 1987

OSTI ID:6411753

Takacs, P Z; Hewitt, R C; Church, E L

This paper concerns the properties of a set of ellipsoidal x-ray mirrors manufactured for use at the National Synchrotron Light Source at Brookhaven. The objective is to compare the results of functional tests made at x-ray wavelengths and at glancing incidence with predictions based on laboratory measurements of their surface shapes made with a Wyko profiling microscope. The functional tests of the fully-illuminated mirrors indicated unacceptable image widths of roughly 300 ..mu..rad. The washout of the sub-image fine structure in the case of the fully-illuminated mirrors is attributed to the presence of longer-wavelength surface errors than are included within the bandwidth of the Wyko measurements. The present analysis is unusual in that it involves the prediction of the effects of shape errors with amplitudes which lie between the smooth-surface limit, where the intensity in the image plane is a mapping of the power spectral density of the error, and the rough-surface limit, where it is a mapping of its slope distribution function.

• Research Organization: Brookhaven National Lab., Upton, NY (USA); Exxon Research and Engineering Co., Annandale, NJ (USA); Picatinny Arsenal, Dover, NJ (USA)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 6411753
• Report Number(s): BNL-39817; CONF-870132-10; ON: DE87010758
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420200* -- Engineering-- Facilities
Equipment
& Techniques
640302 -- Atomic
Molecular & Chemical Physics-- Atomic & Molecular Properties & Theory
656000 -- Condensed Matter Physics
74 ATOMIC AND MOLECULAR PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ACCELERATORS
BREMSSTRAHLUNG
COHERENT SCATTERING
COMPARATIVE EVALUATIONS
CONFIGURATION
CYCLIC ACCELERATORS
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELLIPTICAL CONFIGURATION
MATHEMATICAL MODELS
MIRRORS
NSLS
PERFORMANCE TESTING
RADIATION SOURCES
RADIATIONS
SCATTERING
SYNCHROTRON RADIATION
SYNCHROTRON RADIATION SOURCES
SYNCHROTRONS
TESTING
X-RAY DIFFRACTION