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Thermionic emission and work function of U and UO/sub 2/

Conference ·
OSTI ID:6408579

Thermionic emission measurements have been used to determine the work function (phi) of pure and oxidized uranium samples between 1100 and 1300/sup 0/K; Auger electron spectroscopy (AES) was used to verify the cleanliness and compositions of the samples. It was found that impurities present in ppM amounts in the bulk U segregated to the surface upon heating and had an appreciable effect on the zero-field emission currents as well as the slopes of the Schottkey curves obtained at various temperatures. A combination of ion-sputtering and ultra-high vacuum (UHV) annealing at high temperatures was successful in reducing the total impurity level on the hot surfaces to approx.5%. At this low concentration of impurities, well-behaved Richardson line plots were obtained with A = 135 A cm/sup -2/ K/sup -2/ and phi = 3.54 eV for pure U, and A = 128 A cm/sup -2/ K/sup -2/ and phi = 3.19 eV for UO/sub 2/. The Schottkey coefficients for clean U approached their ideal values at fields > 400 V/cm.

Research Organization:
Lawrence Livermore National Lab., CA (USA)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
6408579
Report Number(s):
UCRL-90427; CONF-8406187-3; ON: DE86002626
Country of Publication:
United States
Language:
English

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