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An analytical threshold voltage and subthreshold current model for short-channel MESFET's

Journal Article · · IEEE Journal of Solid-State Circuits (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/4.192050· OSTI ID:6386820
;  [1]
  1. Rensselaer Polytechnic Inst., Troy, NY (United States)
Short-channel effects on the subthreshold behavior are modeled in self-aligned gate MESFET's with updoped substrates through an analytical solution of the two-dimensional Poisson equation in the subthreshold region. Based on the resultant potential solution, simple and accurate analytical expressions for short-channel threshold voltage, subthreshold swing, and subthreshold drain current are derived. These are then used to develop an expression for minimum acceptable channel length. A comparative study of the short-channel effects in MESFET's with doped and undoped substrates indicates that channel lengths will be limited to 0.15-0.2 [mu]m by subthreshold conduction. Besides offering insight into the device physics of the short-channel effects in MESFET's, the model provides a useful basis for accurate analysis and simulation of small-geometry GaAs MESFET digital circuits.
OSTI ID:
6386820
Journal Information:
IEEE Journal of Solid-State Circuits (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Journal of Solid-State Circuits (Institute of Electrical and Electronics Engineers); (United States) Vol. 28:2; ISSN IJSCBC; ISSN 0018-9200
Country of Publication:
United States
Language:
English

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