VLSI reliability

Book · Sun Dec 31 23:00:00 EST 1989

OSTI ID:6380199

Sabnis, A G ^[1]

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1. AT and T Bell Laboratories, Allentown, PA (US)

This book presents major topics in IC reliability from basic concepts to packaging issues. Other topics covered include failure analysis techniques, radiation effects, and reliability assurance and qualification. This book offers insight into the practical aspects of VLSI reliability.

• OSTI ID: 6380199
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
CRYSTAL STRUCTURE
DESIGN
ELECTRONIC CIRCUITS
INTEGRATED CIRCUITS
MICROELECTRONIC CIRCUITS
MICROSTRUCTURE
QUALITY ASSURANCE
RELIABILITY