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Title: Sputter atomization/resonance ionization mass spectrometry for high sensitivity isotopic analysis

Conference ·
OSTI ID:6374338

Resonance Ionization Mass Spectrometry (RIMS) combines the selectivity and sensitivity of resonance ionization spectroscopy (RIS) with high performance mass spectrometry. Results from our laboratory and elsewhere have been reported for a variety of elements using thermal vaporization sources to produce the atom reservoir for laser-induced resonance ionization. In this paper we describe the use of ion beam sputtering as an ultrasensitive method of atom formation for RIMS. A commercial ion microprobe mass analyzer (IMMA) has been interfaced with a tunable pulsed dye laser for carrying out resonance ionization mass spectrometry of sputtered atoms. This paper will describe the changes necessary to adapt the IMMA instrument for resonance ionization, along with preliminary results for the elements Sm and U. 14 refs., 5 figs.

Research Organization:
Oak Ridge National Lab., TN (USA)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
6374338
Report Number(s):
CONF-850937-2; ON: DE86002198
Resource Relation:
Conference: 28. conference on analytical chemistry, Knoxville, TN, USA, 30 Sep 1985
Country of Publication:
United States
Language:
English