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Title: Ion microprobe mass spectrometry using sputtering atomization and resonance ionization: annual progress report

Technical Report ·
DOI:https://doi.org/10.2172/5819356· OSTI ID:5819356

Resonance Ionization Mass Spectrometry (RIMS) utilizing ion beam sputtering atomization has been applied to the measurement of U and Sm. The goal is to produce an ultrasensitive analytical technique for measuring elements of environmental concern in small particles or inclusions. An ion microprobe mass analyzer (IMMA) has been modified to allow production of a sputtered atom plum through which high powered tunable laser radiation is directed. Ions of a given element are produced by a multistep resonance ionization process followed by extraction into a double-focusing mass spectrometer for detection. Data are presented showing mass and optical spectra obtained as well as the sensitivity of the techniques. 22 refs., 9 figs., 1 tab.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5819356
Report Number(s):
ORNL/TM-9949; ON: DE86011294
Country of Publication:
United States
Language:
English