Insulating, metallic, or semimetallic electronic nature of XSi/sub 2/ compounds: Application to WSi/sub 2/

Journal Article · Sat Aug 01 00:00:00 EDT 1987 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.339695· OSTI ID:6371602

Badoz, P A; Rosencher, E; Torres, J; Fishman, G

We present a model which gives a simple interpretation of already published band-structure calculations in transition-metal disilicides (i.e., XSi/sub 2/, where X stands for Co, Ni, Cr, or W). This approach, based on wave function symmetries, gives physical insight on the insulating, metallic, or semimetallic electronic nature of these silicides. In this theoretical frame, WSi/sub 2/ is predicted to be a strictly compensated semimetal. Extensive electrical measurements performed on various WSi/sub 2/ thin films are consistent with this prediction and indicate that the free-carrier density is less than 3 x 10/sup 21/ cm/sup -3/.

• Research Organization: Centre National d'Etudes des Telecommunications, Chemin du Vieux Chene, B. P.: 98, F-38243, Meylan Cedex, France
• OSTI ID: 6371602
• Journal Information: J. Appl. Phys.; (United States), Vol. 62:3
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COBALT SILICIDES
ELECTRICAL PROPERTIES
ELECTRONIC STRUCTURE
HALL EFFECT
NICKEL SILICIDES
TUNGSTEN SILICIDES
CARRIER DENSITY
EXPERIMENTAL DATA
COBALT COMPOUNDS
DATA
INFORMATION
NICKEL COMPOUNDS
NUMERICAL DATA
PHYSICAL PROPERTIES
REFRACTORY METAL COMPOUNDS
SILICIDES
SILICON COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
TUNGSTEN COMPOUNDS
360104* - Metals & Alloys- Physical Properties