Method for improving x-ray diffraction determinations of residual stress in nickel-base alloys

Patent · Tue Apr 26 04:00:00 EDT 1988

OSTI ID:6361577

Berman, R. M.; Cohen, I.

A process for improving the technique of measuring residual stress by x-ray diffraction in pieces of nickel-base alloys is discussed. Part of a predetermined area of the surface of a nickel-base alloy is covered with a dispersion. This exposes the covered and uncovered portions of the surface of the alloy to x-rays by way of an x-ray diffractometry apparatus, making x-ray diffraction determinations of the exposed surface, and measuring the residual stress in the alloy based on these determinations. The dispersion is opaque to x-rays and serves a dual purpose, since it masks off unsatisfactory signals such that only a small portion of the surface is measured, and it supplies an internal standard by providing diffractogram peaks comparable to the peaks of the nickel alloy so that the alloy peaks can be very accurately located regardless of any sources of error external to the sample. 2 figs.

• Research Organization: Bettis Atomic Power Lab., West Mifflin, PA (USA)
• DOE Contract Number: AC11-76PN00014
• Assignee: Dept. of Energy
• Patent Number(s): PATENTS-US-A7186422
• Application Number: ON: DE89009593
• OSTI ID: 6361577
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360103* -- Metals & Alloys-- Mechanical Properties
656002 -- Condensed Matter Physics-- General Techniques in Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALLOYS
COHERENT SCATTERING
DIFFRACTION
MEASURING METHODS
NICKEL ALLOYS
NICKEL BASE ALLOYS
RESIDUAL STRESSES
SCATTERING
STRESSES
SURFACES
X-RAY DIFFRACTION