Method for improving x-ray diffraction determinations of residual stress in nickel-base alloys
A process for improving the technique of measuring residual stress by x-ray diffraction in pieces of nickel-base alloys is discussed. Part of a predetermined area of the surface of a nickel-base alloy is covered with a dispersion. This exposes the covered and uncovered portions of the surface of the alloy to x-rays by way of an x-ray diffractometry apparatus, making x-ray diffraction determinations of the exposed surface, and measuring the residual stress in the alloy based on these determinations. The dispersion is opaque to x-rays and serves a dual purpose, since it masks off unsatisfactory signals such that only a small portion of the surface is measured, and it supplies an internal standard by providing diffractogram peaks comparable to the peaks of the nickel alloy so that the alloy peaks can be very accurately located regardless of any sources of error external to the sample. 2 figs.
- Research Organization:
- Bettis Atomic Power Laboratory (BAPL), West Mifflin, PA (United States)
- DOE Contract Number:
- AC11-76PN00014
- Assignee:
- Dept. of Energy
- Patent Number(s):
- PATENTS-US-A7186422
- Application Number:
- ON: DE89009593
- OSTI ID:
- 6361577
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
NICKEL BASE ALLOYS
RESIDUAL STRESSES
MEASURING METHODS
SURFACES
X-RAY DIFFRACTION
ALLOYS
COHERENT SCATTERING
DIFFRACTION
NICKEL ALLOYS
SCATTERING
STRESSES
360103* - Metals & Alloys- Mechanical Properties
656002 - Condensed Matter Physics- General Techniques in Condensed Matter- (1987-)