Component presence-absence detection for automated visual inspection of hybrid microcircuits: Final report
An image-processing algorithm has been developed to effectively detect component presence or absence on thin-film hybrid micro- circuits by using an IBM-PC-XT-based vision system consisting of a microscope, computer controlled X-Y stage, digital camera, and a commercial image processing board. The algorithm acquires pixel cross section data from each component and determines how well the acquired data correlate with data from an ideal signal. The accuracy of the algorithm relies on classical hypothesis/significance testing concepts used to establish pixel gray level acceptance values for specific types of components, such as chip capacitors, beam lead devices, and gold ribbons. These values define the threshold of visual acceptance. Devices falling below the established threshold level are rejected. 18 refs., 13 figs., 13 tabs.
- Research Organization:
- Allied-Signal Aerospace Co., Kansas City, MO (USA). Kansas City Div.
- DOE Contract Number:
- AC04-76DP00613
- OSTI ID:
- 6357004
- Report Number(s):
- KCP-613-4050; ON: DE89007596
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
COMPUTER ARCHITECTURE
COMPUTERS
DATA
DIGITAL COMPUTERS
DOCUMENT TYPES
ELECTRONIC CIRCUITS
FILMS
IMAGE PROCESSING
INFORMATION
INSPECTION
MICROCOMPUTERS
MICROELECTRONIC CIRCUITS
MICROSCOPES
NUMERICAL DATA
PERSONAL COMPUTERS
PROCESSING
PROGRESS REPORT
THIN FILMS