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Automatic visual inspection of hybrid microcircuits

Technical Report ·
DOI:https://doi.org/10.2172/5311636· OSTI ID:5311636
An automatic visual inspection system using a minicomputer and a video digitizer was developed for inspecting hybrid microcircuits (HMC) and thin-film networks (TFN). The system performed well in detecting missing components on HMCs and reduced the testing time for each HMC by 75%.
Research Organization:
Bendix Corp., Kansas City, MO (USA)
DOE Contract Number:
AC04-76DP00613
OSTI ID:
5311636
Report Number(s):
BDX-613-2359
Country of Publication:
United States
Language:
English

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