Use of fullerene films as surfaces of uniform electric potential
Journal Article
·
· Applied Physics Letters; (United States)
- Physics Division and Center for Materials Science, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
Continuous fullerene films (85% C[sub 60], 15% C[sub 70]) of thickness [similar to]10 nm have been sublimed on a metallic substrate previously coated with a 1-nm-thick Ge sublayer. The films show no surface potential variations when scanned with a Kelvin probe of 1 mV and 1 mm potential and spatial resolutions. Transmission electron microscopy reveals the fullerene films to be amorphous.
- DOE Contract Number:
- W-7405-ENG-36
- OSTI ID:
- 6349605
- Journal Information:
- Applied Physics Letters; (United States), Journal Name: Applied Physics Letters; (United States) Vol. 63:4; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
AMORPHOUS STATE
CARBON
CHARGED PARTICLE DETECTION
DEPOSITION
DETECTION
DISTRIBUTION
ELECTRON MICROSCOPY
ELEMENTS
EVAPORATION
FILMS
FULLERENES
FUNCTIONS
MICROSCOPY
NONMETALS
PHASE TRANSFORMATIONS
POTENTIALS
RADIATION DETECTION
SPATIAL DISTRIBUTION
SUBLIMATION
SURFACE COATING
SURFACE POTENTIAL
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
WORK FUNCTIONS
360606* -- Other Materials-- Physical Properties-- (1992-)
AMORPHOUS STATE
CARBON
CHARGED PARTICLE DETECTION
DEPOSITION
DETECTION
DISTRIBUTION
ELECTRON MICROSCOPY
ELEMENTS
EVAPORATION
FILMS
FULLERENES
FUNCTIONS
MICROSCOPY
NONMETALS
PHASE TRANSFORMATIONS
POTENTIALS
RADIATION DETECTION
SPATIAL DISTRIBUTION
SUBLIMATION
SURFACE COATING
SURFACE POTENTIAL
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
WORK FUNCTIONS