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Self-aligned InGaP/GaAs heterojunction bipolar transistors for microwave power application

Journal Article · · IEEE Electron Device Letters (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/55.225563· OSTI ID:6343082
; ; ; ; ; ;  [1]; ; ;  [2]
  1. AT and T Bell Labs., Murray Hill, NJ (United States)
  2. General Electric Co., Syracuse, NY (USSR)
As an alternative to AlGaAs/GaAs heterojunction bipolar transistors (HBT's) for microwave applications, InGaP/ GaAs HBT's with carbon-doped base layers grown by metal organic molecular beam epitaxy (MOMBE) are demonstrated with excellent dc, RF, and microwave performance. As previously reported, with a 700-[angstrom]-thick base layer (135-[Omega]/[open square] sheet resistance), a dc current gain of 25, and cutoff frequency and maximum frequency of oscillation above 70 GHz were measured for a 2 [times] 5-[mu]m[sup 2] emitter area device. A device with 12 cells, each consisting of a 2 [times] 15-[mu] m[sup 2] emitter area device for a total emitter area of 360 [mu] m[sup 2], was power tested at 4 GHz under continuous-wave (CW) bias condition. The device delivered 0.6-W output power with 13-dB linear gain and a power-added efficiency of 50%.
OSTI ID:
6343082
Journal Information:
IEEE Electron Device Letters (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Electron Device Letters (Institute of Electrical and Electronics Engineers); (United States) Vol. 14:7; ISSN 0741-3106; ISSN EDLEDZ
Country of Publication:
United States
Language:
English