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Cerium doped GSO scintillators and its application to position sensitive detectors

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6331002
; ; ;

The dependence of the light output and the decay times of Ce doped Gd/sub 2/SiO/sub 5/ on Ce concentration is measured. By using the difference in decay times on Ce concentration for GSO(Ce), the combination of different concentration of GSO(Ce) scintillators is shown to be useful as position sensitive detectors. A Ce doped Gd/sub 2/SiO/sub 5/ (GSO(Ce)) single crystal is an excellent scintillator featuring, a large light output, a short decay time and a high absorption coefficient. Further investigation aimed at its implementation to scintillators has been carried out previously. An application of the GSO(Ce) scintillators to the gamma-ray detectors of positron emission computed tomography has also been shown. The authors have investigated the dependence of its scintillation properties on the Ce concentration and its application to position sensitive detectors.

Research Organization:
Tsukuba Research Lab., Hitachi Chemical Co., Ltd., 48 Wadal, Tsukuba, Ibaraki (JP); Dept. of Physics, Rikkyo Univ., Nishi-Ikebukuro 3, Tokyo (JP)
OSTI ID:
6331002
Report Number(s):
CONF-881103-
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 36:1; ISSN IETNA
Country of Publication:
United States
Language:
English

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Related Subjects

36 MATERIALS SCIENCE
360603 -- Materials-- Properties
440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION SPECTRA
CAMERAS
CERIUM
CHALCOGENIDES
COMPUTERIZED TOMOGRAPHY
DIAGNOSTIC TECHNIQUES
DOPED MATERIALS
ELEMENTS
EMISSION COMPUTED TOMOGRAPHY
GADOLINIUM
GAMMA CAMERAS
MATERIALS
MATERIALS TESTING
MEASURING INSTRUMENTS
METALS
OXIDES
OXYGEN COMPOUNDS
POSITION SENSITIVE DETECTORS
POSITRON COMPUTED TOMOGRAPHY
RADIATION DETECTORS
RARE EARTHS
SCINTILLATIONS
SILICON COMPOUNDS
SILICON OXIDES
SPECTRA
TESTING
TOMOGRAPHY