Perturbation calculation of the I-V characteristic of an extended Josephson junction

Journal Article · Sun Apr 01 04:00:00 EST 1979 · J. Franklin Inst.; (United States)

DOI:https://doi.org/10.1016/0016-0032(79)90050-4· OSTI ID:6328011

Liniger, W; Odeh, F

The running solutions and I-V characteristic of an extended Josephson junction in a state near the ohmic regime are calculated by a perturbation method. Both the voltage-driven and current-driven cases are considered and the convergence of the perturbation procedure is proved. An integral representation of the first correction, in the I-V curve, to the ohmic regime - as well as its dependence on the external magnetic field - is given and evaluated numerically for various values of the junction parameters.

• Research Organization: IBM Thomas J. Watson Research Center, Yorktown Heights, NY
• OSTI ID: 6328011
• Journal Information: J. Franklin Inst.; (United States), Journal Name: J. Franklin Inst.; (United States) Vol. 307:4; ISSN JFINA
• Country of Publication: United States
• Language: English

Related Subjects

656102* -- Solid State Physics-- Superconductivity-- Acoustic
Electronic
Magnetic
Optical
& Thermal Phenomena-- (-1987)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
JOSEPHSON JUNCTIONS
MATHEMATICAL MODELS
NUMERICAL SOLUTION
PERTURBATION THEORY
SUPERCONDUCTING JUNCTIONS
SUPERCONDUCTORS
TUNNEL EFFECT