In situ growth and characterization of La{sub 0.8}Sr{sub 0.2}CoO{sub 3} perovskite mixed conductor films

Journal Article · Mon May 01 04:00:00 EDT 1995 · Journal of the Electrochemical Society

DOI:https://doi.org/10.1149/1.2048643· OSTI ID:63209

Brosha, E L; Chung, B W; Garzon, F H; Raistrick, I D; Houlton, R J; Hawley, M E ^[1]

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1. Los Alamos National Lab., NM (United States)

The authors have grown thin films of La{sub 0.8}Sr{sub 0.2}CoO{sub 3} on SrTiO{sub 3} [100], MgO [100], yttrium-stabilized zirconia YSZ [100], and CeO{sub 2} [100]/Al{sub 2}O{sub 3} substrates by using a 90{degree} off-axis RF magnetron sputtering deposition. X-ray diffraction analysis reveals that, depending on substrate, the deposited films grew either epitaxially or highly textured. Scanning tunneling microscopy reveals that the thin films grow with a smooth surface and with different growth mechanisms according to substrate. For La{sub 0.8}Sr{sub 0.2}CoO{sub 3} thin films grown on MgO [100], the low values of the channeling minimum yield from Rutherford backscattering spectroscopy indicated excellent epitaxy with the substrate. Thin films of perovskite materials are among the major focal research areas for optical, sensor, electronic, and superconducting applications.

• Sponsoring Organization: USDOE
• OSTI ID: 63209
• Journal Information: Journal of the Electrochemical Society, Journal Name: Journal of the Electrochemical Society Journal Issue: 5 Vol. 142; ISSN JESOAN; ISSN 0013-4651
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM OXIDES
CERIUM OXIDES
COBALT OXIDES
EXPERIMENTAL DATA
LANTHANUM OXIDES
MAGNESIUM OXIDES
PEROVSKITES
SPUTTERING
STRONTIUM OXIDES
SUBSTRATES
TEXTURE
TITANIUM OXIDES
VAPOR DEPOSITED COATINGS
ZIRCONIUM OXIDES