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Title: Microcharacterization of trace elemental distributions within individual coal combustion particles using secondary ion mass spectrometry and digital imaging

Journal Article · · Anal. Chem.; (United States)
DOI:https://doi.org/10.1021/ac00144a003· OSTI ID:6316009

Secondary ion image depth profiling is developed for application to the chemical characterization of individual micrometer-sized particles, specifically coal combustion fly ash collected by cascade impaction. A digital imaging system interfaced to a Cameca IMS-3F ion microscope permits the simultaneous acquisition of spatially resolved mass spectral data for a number of single particles. Small regions within each particle are chosen for computer-reconstructed local area depth profiles to minimize complications of particle geometry on sputter rate and useful ion yield. Sputtering rates are calibrated by use of SiO/sub 2/ standards and correlative SEM observation of the sputtered particles. Ion intensities averaged over groups of particles are related to concentrations by use of NBS standard fly ash samples. Substantial differences are often found in the relative concentrations and/or depth profiles of selected elements (Ba, Pb, Si, Th, Ti, U) from particle to particle. The technique is highly sensitive to trace elements within microvolumes. For example, the estimated U detection limit corresponds to approximately 10/sup 4/ atoms in an analytical volume of 0.1 ..mu..m/sup 3/ within a 20-..mu..m/sup 3/ single particle.

Research Organization:
Univ. of North Carolina, Chapel Hill
OSTI ID:
6316009
Journal Information:
Anal. Chem.; (United States), Vol. 59:17
Country of Publication:
United States
Language:
English