In/Si(111)-[radical]3 [times] [radical]3 interface: An unrelaxed [ital T][sub 4] geometry
Journal Article
·
· Physical Review Letters; (United States)
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States) Stanford Electronics Laboratory, Stanford, California 94305 (United States) Department of Physics, Tulane University, New Orleans, Louisiana 70118 (United States) Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Back reflection x-ray standing waves and surface extended x-ray absorption fine structure have determined the atomic coordinates (i.e., the perpendicular displacement [ital and] the near-neighbor bond lengths) at the In/Si(111)-[radical]3 [times] [radical]3 interface. Although the In adatoms are found to reside at a single position, 2.10[plus minus]0.06 A above the first Si bilayer, dual In-Si near-neighbor distances are found: 2.73[plus minus]0.02 A to the first- and 2.49[plus minus]0.03 A to the second-layer Si atoms, respectively. Contrary to the accepted model, our data suggest that the [ital T][sub 4] geometry is not relaxed.
- DOE Contract Number:
- AC03-82ER13000
- OSTI ID:
- 6300423
- Journal Information:
- Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 71:8; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
360606 -- Other Materials-- Physical Properties-- (1992-)
665100 -- Nuclear Techniques in Condensed Matter Physics -- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ADSORPTION
ATOMIC DISPLACEMENTS
BOND LENGTHS
BREMSSTRAHLUNG
CHEMICAL BONDS
COHERENT SCATTERING
COORDINATION NUMBER
DIFFRACTION
DIMENSIONS
ELECTROMAGNETIC RADIATION
ELEMENTS
INDIUM
INTERFACES
LENGTH
METALS
MICROSTRUCTURE
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATIONS
RELAXATION
SCATTERING
SEMIMETALS
SILICON
SORPTION
STABILITY
SURFACE PROPERTIES
SYNCHROTRON RADIATION
X-RAY DIFFRACTION
360602* -- Other Materials-- Structure & Phase Studies
360606 -- Other Materials-- Physical Properties-- (1992-)
665100 -- Nuclear Techniques in Condensed Matter Physics -- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ADSORPTION
ATOMIC DISPLACEMENTS
BOND LENGTHS
BREMSSTRAHLUNG
CHEMICAL BONDS
COHERENT SCATTERING
COORDINATION NUMBER
DIFFRACTION
DIMENSIONS
ELECTROMAGNETIC RADIATION
ELEMENTS
INDIUM
INTERFACES
LENGTH
METALS
MICROSTRUCTURE
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATIONS
RELAXATION
SCATTERING
SEMIMETALS
SILICON
SORPTION
STABILITY
SURFACE PROPERTIES
SYNCHROTRON RADIATION
X-RAY DIFFRACTION