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Simulation of I-V curves of small Josephson tunnel junctions with finite capacitance

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.329224· OSTI ID:6266446

Results of digital and analog simulations of the I-V characteristics of small Josephson tunnel junctions are presented for a variety of cases, and are compared with the recent experimental results of Howard et al. (Appl. Phys. Lett. 35, 879 (1979)) on small-area, high-current-density junctions. The lumped-circuit-element model of Stewart and McCumber with an adjustable nonlinear quasiparticle conductance and various capacitance values is employed. The value of junction capacitance inferred from the digital simulation for a 10/sup -9/-cm/sup 2/ junction is 9 x 10/sup -15/ F. This represents a normalized capacitance ..beta../sub c/ = 0.3 for the junction considered, which had a critical current density roughly-equal10/sup 5/ A/cm/sup 2/. The inferred capacitance is in agreement with the value extrapolated from previous experimental results. Both digital and analog simulations result in I-V curves which show a previously unreported crossing of the quasiparticle and total current curves. This crossing is due to an averaging in time of the voltage across the nonlinear quasiparticle-conductance channel. The crossing is not seen in the experimental results of Howard et al. Differences between the experimental and simulated I-V curves are discussed.

Research Organization:
Becton Center, Department of Engineering and Applied Science, Yale University, New Haven, Connecticut 06520
OSTI ID:
6266446
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 52:6; ISSN JAPIA
Country of Publication:
United States
Language:
English