Ac Josephson effect in hysteretic junctions: Range and stability of phase lock

Journal Article · Fri May 01 00:00:00 EDT 1981 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.329132· OSTI ID:6204820

Kautz, R L

The rf-induced constant voltage steps generated by the ac Josephson effect are studied within the context of the Stewart-McCumber model. Simulations are used to determine the range of current bias over which phase lock occurs for model parameters appropriate to hysteretic tunnel junctions. The effect of noise on phase lock is also considered. The results are applied to a zero-bias voltage standard proposed by Levinsen et al.

• Research Organization: National Bureau of Standards, Electromagnetic Technology Division, Boulder, Colorado 80303
• OSTI ID: 6204820
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 52:5; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COMPUTERIZED SIMULATION
DATA
ELECTRIC POTENTIAL
HYSTERESIS
INFORMATION
JOSEPHSON EFFECT
JOSEPHSON JUNCTIONS
JUNCTIONS
MATHEMATICAL MODELS
NOISE
NUMERICAL DATA
PARAMETRIC ANALYSIS
SIMULATION
STABILITY
SUPERCONDUCTING JUNCTIONS
THEORETICAL DATA