Threshold currents for AlGaAs quantum well lasers
Journal Article
·
· IEEE J. Quant. Electron.; (United States)
The threshold currents for AlGaAs quantum well lasers are studied theoretically. The structure dependent gain coefficient is obtained by taking into account the electron distribution in L valleys. Theoretical threshold current densities calculated using the gain coefficient agree well with reported experimental results for separate-confinement heterostructure lasers. A design procedure for low threshold current laser is elucidated. The lowest threshold currents are 570 and 53 ..mu..A per 1 ..mu..m stripe width for modified multiple quantum well lasers with 32 percent and 90 percent reflectivity facet mirrors, respectively.
- Research Organization:
- Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, 3-9-11 Midoricho, Musashino-shi, Tokyo 180
- OSTI ID:
- 6253621
- Journal Information:
- IEEE J. Quant. Electron.; (United States), Journal Name: IEEE J. Quant. Electron.; (United States) Vol. QE-20:4; ISSN IEJQA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
420300* -- Engineering-- Lasers-- (-1989)
ALUMINIUM ARSENIDES
ALUMINIUM COMPOUNDS
AMPLIFICATION
ARSENIC COMPOUNDS
ARSENIDES
CALCULATION METHODS
CURRENT DENSITY
CURRENTS
ELECTRIC CURRENTS
ELECTRON DENSITY
GAIN
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
HETEROJUNCTIONS
JUNCTIONS
LASER MIRRORS
LASERS
MIRRORS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PNICTIDES
REFLECTIVITY
SEMICONDUCTOR DEVICES
SEMICONDUCTOR JUNCTIONS
SEMICONDUCTOR LASERS
SURFACE PROPERTIES
THRESHOLD CURRENT
420300* -- Engineering-- Lasers-- (-1989)
ALUMINIUM ARSENIDES
ALUMINIUM COMPOUNDS
AMPLIFICATION
ARSENIC COMPOUNDS
ARSENIDES
CALCULATION METHODS
CURRENT DENSITY
CURRENTS
ELECTRIC CURRENTS
ELECTRON DENSITY
GAIN
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
HETEROJUNCTIONS
JUNCTIONS
LASER MIRRORS
LASERS
MIRRORS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PNICTIDES
REFLECTIVITY
SEMICONDUCTOR DEVICES
SEMICONDUCTOR JUNCTIONS
SEMICONDUCTOR LASERS
SURFACE PROPERTIES
THRESHOLD CURRENT