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Oriented growth in oxide thin film heterostructures

Journal Article · · Scripta Metallurgica et Materialia; (United States)
OSTI ID:6253205
; ;  [1]; ; ;  [2]
  1. Purdue Univ., West Lafayette, IN (United States). School of Materials Engineering
  2. Bell Communications Research, Red Bank, NJ (United States)

In this paper, the authors report the structural analysis of La[sub 0.5]Sr[sub 0.5]CoO[sub 3] (LSCo) / Pb[sub 0.9]La[sub 0.1]Zr[sub 0.2]Ti[sub 0.8]O[sub 3] (PLZT) multilayers grown with and without a bismuth titanate (Bi-Ti) template onto yttria-stabilized zirconia (YSZ) coated (001) Si substrates grown by laser ablation. The tetragonal PLZT was expected to have lattice parameters of approximately a [equals] 0.406 nm and c [equals] 0.411 nm, and the cubic LSCo to have a lattice parameter of 0.381 nm. The Bi-Ti layer was used because, with strongly two-dimensional growth, it was expected to form with the (001) basal plane parallel to the growth surface. Such a layered structure could then provide a template for the oriented growth of any subsequent layers.

OSTI ID:
6253205
Journal Information:
Scripta Metallurgica et Materialia; (United States), Journal Name: Scripta Metallurgica et Materialia; (United States) Vol. 29:7; ISSN SCRMEX; ISSN 0956-716X
Country of Publication:
United States
Language:
English