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The effect of post-annealing on laser-deposited superconducting Bi--Sr--Ca--Cu--O thin films

Journal Article · · Journal of Materials Research; (United States)
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  1. Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
Superconducting Bi--Sr--Ca--Cu--O thin films were obtained from post-annealing partially crystallized and amorphous films grown on MgO (100) by pulsed laser deposition. The substrate temperature investigated was in the range of 350--750 [degree]C, over a range of pressure 0.1 to 100 mTorr. The as-deposited films were annealed in 7.5 vol% O[sub 2]/Ar or in air at 800--865 [degree]C from several minutes to a few hours. Unlike the pure Bi[sub 2]Sr[sub 2]CaCu[sub 2]O[sub 8+[delta]] (2212) phase ([ital T][sub [ital c]]=80 K) which is easily formed after a long continuous period of post-annealing at temperature below 830 [degree]C, the formation of (Bi,Pb)[sub 2]Sr[sub 2]Ca[sub 2]Cu[sub 3]O[sub 10+[delta]] (2223) phase from the as-deposited amorphous films requires repetitive annealing cycles of short duration in air at 850 [degree]C to simultaneously achieve good crystal quality, small surface roughness, and sharp diamagnetic transition ([ital T][sub [ital c]]=110 K). After annealing, the temperature is lowered down to [similar to]650 [degree]C by quenching in air and then a slow-cooling step is employed. This procedure was found to enhance the volume fraction of the 2223 phase as compared with a direct slow-cooling process. The trade-off between annealing temperature and time was observed to affect the phase formation and the smoothness of the annealed films. To optimize the post-annealing conditions, Rutherford backscattering spectrometry, x-ray diffraction, and scanning electron microscopy were systematically used to examine the composition, structure, and morphology of the films, respectively.
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
6252917
Journal Information:
Journal of Materials Research; (United States), Journal Name: Journal of Materials Research; (United States) Vol. 8:9; ISSN JMREEE; ISSN 0884-2914
Country of Publication:
United States
Language:
English