Effects of heteroepitaxial strain on Laves phases TbFe{sub 2} and DyFe{sub 2}

Journal Article · Mon Jun 01 04:00:00 EDT 1998 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.367615· OSTI ID:624871

Huth, M; Flynn, C P ^[1]

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1. Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois61801 (United States)

(110) oriented growth was observed for thin films of the highly magnetostrictive Laves phases TbFe{sub 2} and DyFe{sub 2} on Ta (110). On Nb (111), TbFe{sub 2} nucleates in the (111) orientation. Depending on the substrate temperature during growth, varying degrees of residual tensile strain were observed in the films. For TbFe{sub 2} grown on Ta (110) at 680{degree}C, x-ray diffraction revealed a splitting of the (220) Bragg reflection into a strain free component structurally coherent with the template, and a component with 0.5{percent} biaxial tensile strain at room temperature. This strained component can be attributed to the difference in thermal expansion between the sapphire substrate and the TbFe{sub 2} film. Magnetic hysteresis measurements revealed that the axis of easy magnetization lies in the film plane for both (110) and (111) oriented samples. {copyright} {ital 1998 American Institute of Physics.}

• OSTI ID: 624871
• Report Number(s): CONF-980102--
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 11 Vol. 83; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DYSPROSIUM ALLOYS
IRON ALLOYS
LAVES PHASES
MAGNETIZATION
MAGNETOSTRICTION
RESIDUAL STRESSES
TENSILE PROPERTIES
TERBIUM ALLOYS
THERMAL EXPANSION
THIN FILMS
X-RAY DIFFRACTION