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Title: A novel method for determining pulse counting circuitry dead time using the Nuclear Weapons Inspection System

Journal Article · · IEEE Transactions on Nuclear Science
DOI:https://doi.org/10.1109/23.682620· OSTI ID:624206
; ;  [1]
  1. Oak Ridge National Lab., TN (United States). Instrumentation and Controls Div.; and others

A novel method for measuring dead time in nuclear pulse processing circuitry has been developed using the autocorrelation measurement capability of the Nuclear Weapons Inspection System (NWIS). Initially developed for active neutron interrogation of nuclear weapons and other fissile assemblies, NWIS employs a custom gallium arsenide application specific integrated circuit and a new signature analysis software package to simultaneously acquire and display the autocorrelation and cross-correlation spectra of up to five detector/electronics systems. The system operates at clock frequencies up to 1 GHz, permitting the collection of timing pulses in bins as narrow as 1 ns. In normal operation NWIS uses well characterized detectors and constant fraction discriminators, but it may also be configured to accept pulses from any circuit and to use the autocorrelation spectrum to accurately determine dead-time. Unlike traditional dead-time assessment techniques that typically require multiple sources and an assumed dead-time model, NWIS provides single-measurement assessment of circuit dead time and does not require an assumed dead-time model or a calibrated high count-rate source.

Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC05-96OR22464
OSTI ID:
624206
Report Number(s):
CONF-971147-; ISSN 0018-9499; TRN: 98:006459
Journal Information:
IEEE Transactions on Nuclear Science, Vol. 45, Issue 3Pt1; Conference: Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Albuquerque, NM (United States), 11-13 Nov 1997; Other Information: PBD: Jun 1998
Country of Publication:
United States
Language:
English

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