Measurement of two particle resolution in silicon drift detectors

Journal Article · Mon Jun 01 04:00:00 EDT 1998 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.682400· OSTI ID:624142

Pandey, S U; Bellwied, R ^[1]; Beuttenmueller, R ^[2]

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1. Wayne State Univ., Detroit, MI (United States)
2. Brookhaven National Lab., Upton, NY (United States); and others

A study resolving two hits in a 45 x 45 mm rectangular n-type Silicon Drift Detector is presented as a function of drift field using a pulsed Nd:Yag laser. The data are analyzed under the assumption of the general form of a Gaussian distribution in two variables (including correlations). The two hit resolving power degrades with drift distance. As the two electron clouds approach each other their correlation coefficients are shown to increase and be anti-correlated. Arguments for optimal two hit resolution versus drift field are presented. A simple method to determine whether electron cloud distributions arise from multiple overlapping hits or single hits is demonstrated. Practical implications for analyzing data from high occupancy experiments such as STAR at the RHIC collider are discussed.

• Sponsoring Organization: USDOE, Washington, DC (United States); Welch (Robert A.) Foundation, Houston, TX (United States); National Science Foundation, Washington, DC (United States)
• DOE Contract Number: FG02-93ER40795
• OSTI ID: 624142
• Report Number(s): CONF-971147--
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 3Pt1 Vol. 45; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
BROOKHAVEN RHIC
DATA ANALYSIS
PARTICLE TRACKS
SI SEMICONDUCTOR DETECTORS
SPATIAL RESOLUTION