Quantitative ''local-interference'' model for 1/f noise in metal films

Journal Article · Tue Sep 15 04:00:00 EDT 1987 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.36.4479· OSTI ID:6231972

Pelz, J; Clarke, J

Electron scattering calculations by Martin are used to predict the magnitude of resistivity fluctuations in metal films arising from the fluctuating interference of electrons in the local environment of a moving defect. A ''local-interference'' model based on these calculations accounts for the 1/f-noise magnitude observed in irradiated Cu films and in room-temperature metal films. For relatively ordered metal films at room temperature this model predicts larger noise magnitudes than an alternative model based on universal conductance fluctuations, while the latter model predicts larger noise in metals that are sufficiently disordered and/or at lower temperatures.

• Research Organization: Department of Physics, University of California, Berkeley, California 94720
• OSTI ID: 6231972
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 36:8; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRONS
ELEMENTARY PARTICLES
ELEMENTS
FERMIONS
FILMS
FLUCTUATIONS
INTERFERENCE
LEPTONS
METALS
NOISE
PHYSICAL PROPERTIES
SCATTERING
THIN FILMS
VARIATIONS