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Epitaxial films of YBa/sub 2/Cu/sub 3/O/sub 7-//sub delta/ on NdGaO/sub 3/, LaGaO/sub 3/, and SrTiO/sub 3/ substrates deposited by laser ablation

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.101559· OSTI ID:6228971

Frequency-doubled Nd:YAG laser (532 nm) pulses of 1.7 J/cm/sup 2/ and 10 ns duration were used to deposit thin films of YBa/sub 2/ Cu/sub 3/ O/sub 7-//sub delta/ by laser ablation on NdGaO/sub 3/ , LaGaO/sub 3/, and SrTiO/sub 3/ substrates held at 725 +- 5 /sup 0/C in 0.2 Torr of O/sub 2/ ambient. Electrical resistivities versus temperature of all films show normal metallic behavior and sharp superconducting transitions with T/sub c/ (R = 0) at 92--93 K. Critical current densities in 0.3--0.6 ..mu..m thick, 200 ..mu..m long, and 10--30 ..mu..m wide strips were measured to be 10/sup 6/ A/cm/sup 2/ at 60, 77, and 80 K in the films on LaGaO/sub 3/, NdGaO/sub 3/, and SrTiO/sub 3/, respectively. X-ray diffraction patterns show that all films grew epitaxially, with domains of only two crystalline orientations rotated 90/sup 0/ with respect to each other in the a-b plane (consistent with twins), and the c axis perpendicular to the substrates. The closely matched lattice constants of the film and substrates (0.8--2.1%) result in epitaxial growth of the films.

Research Organization:
IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598
OSTI ID:
6228971
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 54:11; ISSN APPLA
Country of Publication:
United States
Language:
English

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