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X-ray study of in-plane epitaxy of YBa/sub 2/Cu/sub 3/O/sub /ital x// thin films

Journal Article · · Phys. Rev. B: Condens. Matter; (United States)
Detailed x-ray scattering measurements in three dimensions are reported for thin YBa/sub 2/Cu/sub 3/O/sub /ital x// films on (001) SrTiO/sub 3/ and KTaO/sub 3/ substrates. The films, produced by coevaporation followed by a postdeposition anneal, consist of domains epitaxially oriented with either the /ital a/ axis or the /ital c/ axis aligned with the substrate normal. The in-plane epitaxy of grains with the /ital c/ axis parallel to the normal shows an alignment of the <110> directions of the film and the substrate, rather than of the <100> directions as is generally presumed. We associate this alignment with a strain relaxation during the high-temperature tetragonal-to-orthorhombic phase transition.
Research Organization:
Solid State Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831-6024(US)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
6226339
Journal Information:
Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 39:16; ISSN PRBMD
Country of Publication:
United States
Language:
English