X-ray characterization of in-plane ordering in YBa sub 2 Cu sub 3 O sub 7 minus x thin films using a standard Weissenberg camera

Journal Article · Mon Jan 28 04:00:00 EST 1991 · Applied Physics Letters; (USA)

DOI:https://doi.org/10.1063/1.104650· OSTI ID:6195161

Perrin, A; Karkut, M G; Guilloux-Viry, M; Sergent, M ^[1]

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1. Laboratoire de Chimie Minerale B, Universite de Rennes I, URA CNRS 254, Avenue du General Leclerc, 35042 Rennes Cedex, France (FR)

We have used a standard Weissenberg camera in the oscillating mode to characterize the in-plane structure of YBa{sub 2}Cu{sub 3}O{sub 7} thin films. We find that for films optimally grown on (100) MgO or (100) SrTiO{sub 3} substrates, the in-plane film axes are aligned parallel to the substrate axes. This is true both for solely {ital c}-axis oriented films (perpendicular to the film plane) and for mixed {ital a}- and {ital c}-axis oriented films. For a film grown on (110) SrTiO{sub 3}, we have established that the film orientation perpendicular to the film plane is solely (103) and not (110) or a mixture of the two. In addition the in-plane film axes are colinear to the substrate axes.

• OSTI ID: 6195161
• Journal Information: Applied Physics Letters; (USA), Journal Name: Applied Physics Letters; (USA) Vol. 58:4; ISSN APPLA; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
BARIUM OXIDES
CAMERAS
CHALCOGENIDES
COHERENT SCATTERING
COPPER COMPOUNDS
COPPER OXIDES
CRYSTAL STRUCTURE
CRYSTALLOGRAPHY
DIFFRACTION
FILMS
HIGH-TC SUPERCONDUCTORS
OXIDES
OXYGEN COMPOUNDS
SCATTERING
SUPERCONDUCTING FILMS
SUPERCONDUCTORS
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION
YTTRIUM COMPOUNDS
YTTRIUM OXIDES