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Investigation of ZnO/InP heterostructure solar cells

Thesis/Dissertation ·
OSTI ID:6185379
Zinc oxide/indium phosphide semiconductor/interfacial layer/semiconductor heterostructure solar cells fabricated by chemical spraying were investigated. Diagnostic studies of indium phosphide oxidation, gold/indium phosphide devices and zinc oxide thin films were undertaken. Zinc oxide/indium phosphide heterostructures fabricated by chemical spraying are stable semiconductor/interfacial layer/semiconductor structures of n-zinc oxide, an interfacial thermal oxide and single-crystal p-indium phosphide. Forward leakage currents are dominated by tunneling and interfacial recombination processes, and are analyzed with a thermionic-field emission model. High-temperature processing increases the forward leakage currents and yields an apparent increase in the density of near-interface localized states. Interfacial oxides suppress the formation of near-interface states, and are essential in obtaining optimal photovoltaic performance. Heterostructures fabricated with very thin oxides exhibit severe forward leakage and photoenhanced reverse leakage after post-deposition annealing in hydrogen. Thick interfacial oxides cause current-voltage photosuppression and hysteresis effects. Optimized zinc oxide/indium phosphide heterostructures have short-circuit current densities greater than 23 mA/cm/sup 2/, open-circuit voltages of 0.68-0.72 V, fill factors above 0.7 and active area efficiencies of 13-14% in natural sunlight.
OSTI ID:
6185379
Country of Publication:
United States
Language:
English

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