Atomic resolution imaging of noble metal thin films by scanning tunneling microscopy

Journal Article · · Applied Physics Communications; (USA)

OSTI ID:6182356

Kim, H S; Zheng, Y C; Bryant, P J ^[1]

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1. Univ. of Missouri, Kansas City (USA)

The authors present scanning tunneling microscope (STM) images which resolve rows of close-packed metal atoms on the surface of Cu, Ag, and Au thin films. These samples were prepared by evaporating metallic elements onto cleaved graphite substrates in vacuum with a base pressure of 10{sup {minus}6} Torr. The thickness of the thin films is a few hundred angstroms, Cu(111), Ag(111), Au(111), and Au(110) films deposited on the surface of pyrolytic graphite have been imaged in air using a STM with low bias voltage, operating in the constant current mode. An average corrugation amplitude of {approx} 0.3 {angstrom} was measured for the Cu, Ag, and Au surfaces. The observed results are in good agreement with the structures predicted from theory.

• OSTI ID: 6182356
• Journal Information: Applied Physics Communications; (USA), Journal Name: Applied Physics Communications; (USA) Vol. 10:1-2; ISSN 0277-9374; ISSN APCOD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
COPPER
ELECTRON MICROSCOPY
ELEMENTS
FILMS
GOLD
MEASURING METHODS
METALS
MICROSCOPY
SCANNING ELECTRON MICROSCOPY
SILVER
STRUCTURAL CHEMICAL ANALYSIS
SURFACE PROPERTIES
THIN FILMS
TRANSITION ELEMENTS