Imaging mass spectrometry of particulate-associated polynuclear aromatic hydrocarbons

Conference · Tue Dec 31 04:00:00 EST 1996

OSTI ID:617666

Holland, M J; Linton, R W ^[1]; Steger, J L ^[2]

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1. Univ. of North Carolina, Chapel Hill, NC (United States)
2. Radian Corporation, Research Triangle Park, NC (United States); and others

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was employed for the Ln situ investigation of PAHs on individual environmental particulates. TOF-SIMS is a microprobe mass spectrometry technique capable of providing surface elemental and chemical information with lateral spatial resolution < 1 {mu}m. TOF-SIMS analysis allows for the correlation of microscopic characteristics of different particulate, filter, and sorbent substrates with adsorbed organic species. Silver membrane and glass fiber filters loaded with coal flyash or silica gel were placed in a Method 0010 spitting train and exposed to vapor phase benzo[a]anthracene, benzo[g,h,i]perylene or pyrene. TOF-SIMS allowed surface chemical analysis of single particles on Ag filter media taken directly from the Method 0010 sampling train, without additional sample preparation. Secondary ion images indicated that benzo[a]anthracene is found primarily on the filter media and not on the flyash surfaces, and is of interest with respect to the elucidation of sampling artifacts. Particulate matter was also transferred to silicon wafers where native levels of diesel soot POM were imaged using TOF-SIMS. 20 refs., 6 figs., 2 tabs.

• OSTI ID: 617666
• Report Number(s): CONF-9605175--
• Country of Publication: United States
• Language: English

Related Subjects

20 FOSSIL-FUELED POWER PLANTS
54 ENVIRONMENTAL SCIENCES
AIR POLLUTION MONITORING
DIESEL ENGINES
FLY ASH
PERFORMANCE TESTING
POLYCYCLIC AROMATIC HYDROCARBONS
SOOT
TIME-OF-FLIGHT MASS SPECTROMETERS