Imaging mass spectrometry of particulate-associated polynuclear aromatic hydrocarbons

Technical Report · Tue Dec 31 04:00:00 EST 1996

OSTI ID:422169

Holland, M J; Linton, R W; Steger, J L; Merrill, R G; Strossman, G S

Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) was employed for the in situ investigation of PAHs on individual environmental particulates. TOF-SIMS is a microprobe mass spectrometry technique capable of providing surface elemental and chemical information with lateral spatial resolution less than 1 um. TOF-SIMS analysis allows for the correlation of microscopic characteristics of different particulate, filter, and sorbent substrates with adsorbed species. Silver membrane and glass fiber filters loaded with coal flyash or silica gel were placed in a method 0010 spiking train and exposed to vapor phase benzo(a)anthracene, benzo(g,h,i)perylene or pyrene. TOF-SIMS allowed surface chemical analysis of single particles on Ag filter media taken directly from the Method 0010 sampling train, wthout additional sample preparation. Seconary ion images indicated that benzo(a)anthracene is found primarily on the filter media and not on the flyash surfaces, and is of interest with respect to the elucidation of sampling artifacts. Particulate matter was also transferred to silicon wafers where native levels of diesel soot POM were imaged using TOF-SIMS.

• Research Organization: North Carolina Univ., Chapel Hill, NC (United States). Dept. of Chemistry
• OSTI ID: 422169
• Report Number(s): PB--97-122758/XAB; CNN: Contract EPA-68-D4-0022
• Country of Publication: United States
• Language: English

Related Subjects

54 ENVIRONMENTAL SCIENCES
AIR POLLUTION MONITORING
PARTICULATES
POLYCYCLIC AROMATIC HYDROCARBONS