Soft x-ray fluorescence spectroscopy using tunable synchrotron radiation
Conference
·
OSTI ID:61760
- Uppsala Univ. (Sweden)
The third generation synchrotron radiation sources open up new interesting possibilities for soft x-ray emission spectroscopy (SXES) for the study of various problems in materials science and atomic and molecular physics. High brightness of the excitation source is a prerequisite for pursuing SXES, since the overall yields are very small owing to both low fluorescence yields and low efficiencies of high resolution soft x-ray detectors. However, the very brightness offered by the third generation synchrotron radiation sources even allows the exciting beam to be sharply monochromatised, a condition which very much increases the information potential of this spectroscopic technique.
- Research Organization:
- Argonne National Lab., IL (United States)
- OSTI ID:
- 61760
- Report Number(s):
- ANL/APS/TM--14; CONF-9404198--; ON: DE95006077
- Country of Publication:
- United States
- Language:
- English
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