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U.S. Department of Energy
Office of Scientific and Technical Information

Apparatus for irradiation with charged particle beams

Patent ·
OSTI ID:6166240

An apparatus according to the present invention for irradiating a specimen with charged particle beams comprises a single charged particle generating source from which the charged particle beams formed of electrons and negative ions, respectively, can be simultaneously derived; a specimen holder on which the specimen is placed; and charged particle irradiation means which is interposed between the charged particle generating source and the specimen holder in order to focus the charged particle beams and to irradiate the surface of the specimen with the focused beams, and which includes at least one magnetic lens and at least one electrostatic lens that are individually disposed.

Assignee:
Hitachi Ltd. (Japan)
Patent Number(s):
US 4479060
OSTI ID:
6166240
Country of Publication:
United States
Language:
English