The Use of X-Ray Microbeams in Materials Science
Conference
·
OSTI ID:6151
- ORNL
Most materials are heterogeneous on mesoscopic length scales (tenths-to-tens of microns), and materials properties depend critically on mesoscopic structures such as grain sizes, texture, and impurities. The recent availability of intense, focused x-ray microbeams at synchrotron facilities has enabled new techniques for mesoscale materials characterization. We describe instrumentation and experiments on the MHATT-CAT and UNICAT undulator beamlines at the Advanced Photon Source which use micron and submicron-size x-ray beams to investigate the grain orientation, local strain and defect content in a variety of materials of technological interest. Results from a combinatorial study on epitaxial growth of oxide films on textured metal substrates will be described to illustrate x-ray microbeam capabilities.
- Research Organization:
- Oak Ridge National Laboratory (ORNL); Oak Ridge, TN
- Sponsoring Organization:
- USDOE Office of Energy Research (ER)
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 6151
- Report Number(s):
- ORNL/CP-102319; KC 02 02 04 0; ON: DE00006151
- Country of Publication:
- United States
- Language:
- English
Similar Records
3-D Measurement of Deformation Microstructure of Al(0.2%)Mg Using Submicron Resolution White X-Ray Microbeams
X-Ray Microbeam Measurement of Local Texture and Strain in Metals
Engineering, design and construction of the MHATT-CAT Sector at the APS. Final technical report
Conference
·
Sun Nov 28 23:00:00 EST 1999
·
OSTI ID:751483
X-Ray Microbeam Measurement of Local Texture and Strain in Metals
Conference
·
Tue Apr 06 00:00:00 EDT 1999
·
OSTI ID:755655
Engineering, design and construction of the MHATT-CAT Sector at the APS. Final technical report
Technical Report
·
Wed Jan 24 23:00:00 EST 2001
·
OSTI ID:798163