Bayesian Zero-Failure (BAZE) reliability demonstration testing procedure

Journal Article · Sun Jul 01 04:00:00 EDT 1979 · J. Qual. Technol.; (United States)

OSTI ID:6121232

Martz, Jr, H F; Waller, R A

A Bayesian Zero-Failure (BAZE) reliability demonstration testing procedure is presented. The method is developed for an exponential failure-time model and a gamma prior distribution on the failure rate. The method provides the required total fixed test time, according to a single posterior risk criterion, that is required in order to pass a test in which no failures are observed. A simple approach using percentiles is used to select a prior distribution. The step-by-step method is easily applied in practice and an example is given.

• Research Organization: Los Alamos Scientific Lab., NM
• OSTI ID: 6121232
• Journal Information: J. Qual. Technol.; (United States), Journal Name: J. Qual. Technol.; (United States) Vol. 11:3; ISSN JQUTA
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420200* -- Engineering-- Facilities
Equipment
& Techniques
420500 -- Engineering-- Materials Testing
EQUIPMENT
FAILURE MODE ANALYSIS
FAILURES
MATHEMATICAL MODELS
PERFORMANCE TESTING
QUALITY ASSURANCE
RECOMMENDATIONS
RELIABILITY
STATISTICAL MODELS
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS
TESTING