Grain boundaries

Technical Report · Tue Jan 01 04:00:00 EST 1991

DOI:https://doi.org/10.2172/6114381· OSTI ID:6114381

Balluffi, R W; Bristowe, P D

The present document is a progress report describing the work accomplished to date during the second year of our four-year grant (February 15, 1990--February 14, 1994) to study grain boundaries. The research was focused on the following three major efforts: Study of the atomic structure of grain boundaries by means of x-ray diffraction, transmission electron microscopy and computer modeling; study of short-circuit diffusion along grain boundaries; and development of a Thin-film Deposition/Bonding Apparatus for the manufacture of high purity bicrystals.

• Research Organization: Massachusetts Inst. of Tech., Cambridge, MA (United States). Dept. of Materials Science and Engineering
• Sponsoring Organization: DOE; USDOE, Washington, DC (United States)
• DOE Contract Number: FG02-87ER45310
• OSTI ID: 6114381
• Report Number(s): DOE/ER/45310-35; ON: DE92004420
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
BICRYSTALS
COHERENT SCATTERING
COMPUTERIZED SIMULATION
CRYSTAL STRUCTURE
CRYSTALS
DIFFRACTION
DOCUMENT TYPES
ELECTRON MICROSCOPY
ELEMENTS
GERMANIUM
GOLD
GRAIN BOUNDARIES
METALS
MICROSCOPY
MICROSTRUCTURE
POLYCRYSTALS
PROGRESS REPORT
SCATTERING
SEGREGATION
SEMIMETALS
SILICON
SIMULATION
TRANSITION ELEMENTS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION