Structural and magnetic properties of CoCrTa films with Cr

Journal Article · · Applied Physics Communications; (USA)

DOI:https://doi.org/10.1063/1.344808· OSTI ID:6114351

Sellmyer, D J; Wang, D ^[1]; Christner, J A; Maffitt, K N ^[2]

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1. Univ. of Nebraska, Lincoln (USA)
2. Imprimis/CDC, Minneapolis, MN (USA)

The authors report studies of epitaxial growth of CoCrTa films on Cr underlayers and the properties of CoCrTa/Cr multilayers. A H{sub c} value of 1,300 Oe was obtained for a Ta composition of 2 at%, a Cr underlayer thickness of 4,000 {angstrom} and a magnetic layer thickness of 400 {angstrom}. The x-ray data show that the high H{sub c} occurs when crystallites of the Cr underlayer and CoCrTa layer are aligned with the Cr (200) and CoCrTa (110) planes in the film plane. Thus the c-axis of the CoCrTa lies essentially in the plane of the film. When the thickness of the magnetic layer increase above 1,000 {angstrom} the c-axis begins to tip out of the film plane. For the CoCrTa/Cr multilayered films, H{sub c} values up to 1,200 Oe were obtained although the c-axis orientation of the magnetic layer becomes somewhat dispersed. Models for the dependence of magnetization reversal on microstructure are discussed.

• OSTI ID: 6114351
• Journal Information: Applied Physics Communications; (USA), Vol. 10:1-2; ISSN 0277-9374
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CHROMIUM COMPOUNDS
CHEMICAL PREPARATION
MAGNETIC PROPERTIES
STRUCTURAL CHEMICAL ANALYSIS
COBALT COMPOUNDS
TANTALUM COMPOUNDS
CRYSTAL STRUCTURE
EPITAXY
FILMS
MAGNETIZATION
MICROSTRUCTURE
PHYSICAL PROPERTIES
REFRACTORY METAL COMPOUNDS
SYNTHESIS
TRANSITION ELEMENT COMPOUNDS
360101* - Metals & Alloys- Preparation & Fabrication
360102 - Metals & Alloys- Structure & Phase Studies
360104 - Metals & Alloys- Physical Properties