Analytical photon scanning tunneling microscopy

Journal Article · Mon Oct 01 00:00:00 EDT 1990 · Physical Review, B: Condensed Matter; (USA)

DOI:https://doi.org/10.1103/PhysRevB.42.6750· OSTI ID:6113746

Paesler, M A; Moyer, P J; Jahncke, C J ^[1]; Johnson, C E ^[2]; Reddick, R C; Warmack, R J; Ferrell, T L ^[3]

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1. Physics Department, North Carolina State University, Raleigh, NC (USA) Precision Engineering Center,North Carolina State University, Raleigh, NC (USA)
2. Physics Department, North Carolina State University, Raleigh, NC (USA)
3. Health and Safety Research Division, Oak Ridge National Laboratory, Oak Ridge, TN (USA) Department of Physics and Astronomy, University of Tennessee, Knoxville, TN (USA)

The photon scanning tunneling microscope (PSTM) has been operated in spectroscopic mode to both image the topography and analyze stress features on a microindented, chromium-implanted sapphire surface. Light originating primarily from the evanescent field generated by an internally reflected beam, with some contribution from scattering by roughness features and radiation from fluorescence and luminescence, was coupled into the probe tip. The topographic resolution observed ({approximately}50 nm) is appreciably finer than the diffraction limit. Stresses of 3 kbar around microindents were measured by monitoring shifts in the photoluminescence peaks. A discussion of the spectroscopic resolution obtainable with this analytical PSTM'' and applications are presented.

• DOE Contract Number: AC05-84OR21400
• OSTI ID: 6113746
• Journal Information: Physical Review, B: Condensed Matter; (USA), Vol. 42:10; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
47 OTHER INSTRUMENTATION
36 MATERIALS SCIENCE
SAPPHIRE
SURFACE PROPERTIES
SCANNING ELECTRON MICROSCOPY
SPATIAL RESOLUTION
CHROMIUM ADDITIONS
PHOTOLUMINESCENCE
STRESSES
ALLOYS
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
CHALCOGENIDES
CHROMIUM ALLOYS
CORUNDUM
ELECTRON MICROSCOPY
LUMINESCENCE
MICROSCOPY
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
RESOLUTION
400101* - Activation
Nuclear Reaction
Radiometric & Radiochemical Procedures
440800 - Miscellaneous Instrumentation- (1990-)
360602 - Other Materials- Structure & Phase Studies