Diffuse reflectance and photoacoustic Fourier transform infrared spectra of silica surfaces under polarizable gases

Journal Article · Tue Sep 01 04:00:00 EDT 1987 · Appl. Spectrosc.; (United States)

DOI:https://doi.org/10.1366/0003702874447563· OSTI ID:6095507

Story, W C; Masujima, T; Liang, J; Liu, G; Eyring, E M; Harris, J M; Anderson, L L

It has been reported that the use of an infrared transparent polarizable gas such as xenon enhances the FT-IR photoacoustic signal of some species adsorbed on a sample surface. Diffuse reflectance and photoacoustic FT-IR methods were used to obtain spectra of silica surfaces under helium, nitrogen, and xenon. Absence of the reported effect with both techniques is shown, and a tentative explanation for these results is given.

• Research Organization: Department of Chemistry, University of Utah, Salt Lake City, Utah 84112
• OSTI ID: 6095507
• Journal Information: Appl. Spectrosc.; (United States), Journal Name: Appl. Spectrosc.; (United States) Vol. 41:7; ISSN APSPA
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102* -- Chemical & Spectral Procedures
CHALCOGENIDES
ELEMENTS
FLUIDS
GASES
HELIUM
HYDROGEN
INFRARED SPECTRA
MINERALS
NONMETALS
OPTICAL PROPERTIES
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHOTOACOUSTIC SPECTROSCOPY
PHYSICAL PROPERTIES
RARE GASES
SILICA
SILICON COMPOUNDS
SILICON OXIDES
SPECTRA
SPECTRAL REFLECTANCE
SPECTROSCOPY
SURFACES
XENON