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In situ Detection of Adsorbates at Silica/Solution Interfaces by Fourier Transform Infrared Attenuated Total Reflection Spectroscopy Using a Silica-Coated Internal Reflection Element

Journal Article · · Applied Spectroscopy
 [1];  [2];  [2];  [2]
  1. University of Utah, Salt Lake City, UT (United States); Western Oregon University, Monmouth, OR (United States)
  2. University of Utah, Salt Lake City, UT (United States)

A silica-coated ZnSe internal reflection element (IRE) was used to acquire attenuated total reflection (ATR) Fourier transform infrared (FT-IR) spectra of ethyl acetate at an n-heptane/silica surface. A thin silica film was deposited onto the IRE by withdrawing the substrate from a suspension of fumed silica; upon drying, a durable, porous SiO2 layer is formed on the IRE that is stable in contact with aprotic solvents. The layer thickness is targeted to be comparable to the depth of penetration of infrared radiation beyond the IRE/film interface. These films were used to investigate the adsorption of ethyl acetate onto silica from n-heptane. Here, a multidimensional least-squares fit of the spectroscopic data reveals multiple surface-site energies on the silica surface, as reflected in both the solution concentration dependence of ethyl acetate accumulation on the surface and the frequencies of vibrational modes that shift upon adsorption.

Research Organization:
University of Utah, Salt Lake City, UT (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Chemical Sciences, Geosciences & Biosciences Division (CSGB); National Science Foundation (NSF)
Grant/Contract Number:
FG03-93ER14333
OSTI ID:
2480729
Alternate ID(s):
OSTI ID: 304225
Journal Information:
Applied Spectroscopy, Journal Name: Applied Spectroscopy Journal Issue: 11 Vol. 52; ISSN 0003-7028
Publisher:
Society for Applied SpectroscopyCopyright Statement
Country of Publication:
United States
Language:
English

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